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Keywords
NRP
Energy loss
AFM
Evaluation
HfO2
Nanoparticles
X-ray diffraction
Alumine poreuse
Nickel
7550Ee
Silicon Carbide
XPS
27Aldp
27Ald p&α
Silicon carbide
Low energy electron diffraction LEED
Alloy
XRD
Passivation
Al2O3
Multilayer
Sputtering
13C
Pb centers
2H
AC susceptibility
17Opp
ALD
Diffusion
Epitaxy
Acoustic propreties of solid
Capillary condensation
Topological defects
7630Lh
PIXE
15N
Isotopic Tracing
17Op
SiC
RBS
Periodic multilayer
Oxidation
Adsorption Isotherms
Magnetic anisotropy
Nuclear reaction analysis
Ion implantation
Raman spectroscopy
6855Jk
Growth
7550Pp
Auger electron spectroscopy AES
8140Ef
Annealing
Silicon
Transparent conductive oxide TCO
Metal-insulator transition
Acoustic
Pulsed laser deposition
Silica
Oxygen deficiency
18O
Thin films
Topological insulators
Stable isotopic tracing
Nitridation
Aluminum
Photoluminescence
Channeling
Epitaxial growth
18O resonance
Gallium oxide
Nanostructures
3C-SiC
Hysteresis
Indium oxide
Defects
Density functional theory
Zinc oxide
Aluminium
Kossel diffraction
Magnetization curves
Atomic Layer Deposition ALD
Charge exchange
Adsorption
Magnetic semiconductors
EPR
Ion beam analysis
Rutherford backscattering spectrometry RBS
Adsorbed layers
Measurement
Ageing
Nuclear resonance profiling NRP
Interface defects
17O
27Alda
Ferromagnetic resonance
Alloys
GaMnAs
Gold
ADSORPTION DESORPTION HYSTERESIS