Kossel diffraction Hysteresis ADSORPTION DESORPTION HYSTERESIS Capillary condensation Energy loss 2H 7630Lh Gold Epitaxy NRA Nanostructures NRP Topological insulators 17Opp Raman spectroscopy GaMnAs Stable isotopic tracing Nuclear reaction analysis Ferromagnetic resonance Nickel 15N 3C-SiC Adsorbed layers 7550Ee Acoustic Magnetic anisotropy Nuclear resonance profiling NRP Adsorption Silicon Magnetization curves Channeling 27Ald p&α 17O EPR ALD Transparent conductive oxide TCO Magnetic semiconductors Diffusion Adsorption Isotherms AFM Silicon Carbide XPS Measurement RBS Auger electron spectroscopy AES Atomic Layer Deposition ALD Aluminum Photoluminescence Passivation Pb centers Sputtering Periodic multilayer Al2O3 27Aldp 13C Silicon carbide 6855Jk Low energy electron diffraction LEED 17Op Epitaxial growth Silica Gallium oxide Multilayer Charge exchange Ageing Density functional theory Nanoparticles HfO2 27Alda Defects Indium oxide 18O resonance Pulsed laser deposition Thin films Interface defects SiC Ion implantation XRD Evaluation Oxygen deficiency Alloys Thin film Isotopic Tracing Growth Nitridation Metal-insulator transition Aluminium Annealing Acoustic propreties of solid AC susceptibility 7550Pp 8140Ef X-ray diffraction 18O Topological defects Rutherford backscattering spectrometry RBS Zinc oxide PIXE Ion beam analysis Oxidation